| PATENT REGISTER | |||||||||
| Status | Lapsed | Patent No. | 2352017 | ||||||
|---|---|---|---|---|---|---|---|---|---|
| Application No. | 11000172.4 | Date of Filing | 12/10/2009 | ||||||
| Date Grant Published | 31/07/2013 | Application Published | 03/08/2011 | ||||||
| Title of Invention | Method for testing a capacitive measuring device | ||||||||
| Priority |
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| Inventor | Gehrig, Reto | ||||||||
| Current Proprietor |
Uster Technologies AG Sonnenbergstrasse 10 8610 Uster SWITZERLAND |
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| Earlier Application No. 09748935.5 | Lapsed | ||||||||
| Publication Language | German | ||||||||
| Translation Received Date | |||||||||
| 11/07/2014 | Patent lapsed due to non-payment of Patent Renewal Fee in respect of year 5. | ||||||||
| 27/08/2014 | (Parent) Earlier Application number:09748935.5 Publication number: Date of receipt:12/10/2009 00:00:00 | ||||||||
